The additional protection features available on the secure MT25Q device include a lock status register bit, top/bottom block address protection lock, volatile configuration lock register at power up, protection management register lock, and a nonvolatile configuration lock register.
TN-12-30: NOR Flash Cycling Endurance and Data Retention
This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.
This technical note provides PCB designers basic guidelines for optimizing signal layout and power supply lines in Micron's Serial NOR Flash device to prevent signal integrity problems.
CSN-24: ESD Precautions for Die/Wafer Handling and Assembly
Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.