TN-FC-67: Usage Model Collection and Emulation for e.MMC
This technical note presents best practices for recording usage model (UM) data from a Linux® system, and then explains in detail a UME report resulting from the usage model analysis and accelerated usage model test.
TN-FC-64: e.MMC Robustness Design-in Checklist
This technical note is a design-in checklist for e.MMC and 5.1 devices, created to help customers plan resources for their automotive memory designs during the design-in phase.
TN-FC-42: e.MMC Device Health Report
This technical note describes the device health report procedure for Micron Automotive 5.0 and 5.1 e.MMC Micron firmware.
TN-52-07: e.MMC Partitioning
This technical note is a guide for partitioning an e.MMC device according to the 4.41 version of the JEDEC specification and above. It discusses how to set a physical partition configuration, how to set a general or enhanced partition, and how to access a partition in addition to explaining the registers used in partitioning.
TN-52-05: e.MMC Linux Enablement
This technical note describes supported and unsupported e.MMC features and how to enable them in Linux. It includes a discussion of the e.MMC standard (4.41) introduced in March 2010.
TN-FC-06: Booting from e.MMC
This technical note describes the features of booting a system from an embedded MultiMediaCard (e.MMC) device. It discusses the boot capabilities in the 4.41 version of the JEDEC e.MMC specification and above and explains how to configure an e.MMC device to have the required booting features, program and verify boot code on an e.MMC device, and perform a boot operation to send boot data to the host.
TN-FC-47: e.MMC Data Removal
This TN explains the commands used to remove data from an e.MMC device. All information applies to an automotive e.MMC with controller 5.0.
TN-2990: Managed NAND - Soft Error Rate
Technical Notes (PDF)
This technical note outlines a method of detecting and handling bit flips in a manner consistent with JEDEC specifications for operation of managed NAND devices.
TN-FC-27: e.MMC Power Loss Data Integrity
This technical note describes how to ensure the integrity of internal system data and user data in the Micron e.MMC device during power loss.