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IBIS Behavioral Models:
Micron has been a member of the IBIS Open Forum for many years and fully supports the IBIS specification. IBIS models for most Micron products are available for download from the Micron Web site.
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TN-00-07
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11/2009
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163.98 KB
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Technical Note
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Thermal Applications:
Defines a general method and criteria for measuring and ensuring that Micron components and modules do not exceed the maximum allowable temperature
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TN-00-08
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05/2010
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252.18 KB
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Technical Note
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Understanding Quality and Reliability Requirements for Bare Die Applications:
Describes the quality and reliability requirements for bare die applications
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TN-00-14
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10/2009
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152.83 KB
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Technical Note
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Recommended Soldering Parameters:
Defines the recommended soldering techniques and parameters for Micron Technology, Inc., products.
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TN-00-15
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03/2007
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69.09 KB
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Technical Note
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Uprating of Semiconductors for High-Temperature Applications:
Describes the issues associated with temperature uprating and the risks involved in using components and/or systems outside the manufacturer's environmental specifications
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TN-00-18
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05/2010
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428.33 KB
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Technical Note
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Understanding Signal Integrity:
Describes how memory design, test, and verification tools can be used to the greatest advantage, from conception of a new product through end of life
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TN-00-20
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12/2009
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1.52 MB
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Technical Note
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SEMI Wafer Map Format:
Micron has adopted the wafer map file format approved by Semiconductor Equipment and Materials International (SEMI). With SEMI formatting, Micron's customers can be confident they will always receive consistent, compatible, reliable map files.
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TN-00-21
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02/2009
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110 KB
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Technical Note
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RLDRAM 2 Design Guide:
Describes the general features of circuit implementations using RLDRAM 2 memory architecture
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TN-49-01
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06/2008
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329.19 KB
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Technical Note
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Exploring the RLDRAM 2 Feature Set:
Outlines the performance-enhancing features offered by RLDRAM 2 architecture
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TN-49-02
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12/2006
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453.86 KB
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Technical Note
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RLDRAM 2 Clocking Strategies:
Addresses the operation of the RLDRAM 2 device outside the specified range of clock periods and the timing changes that occur in this mode of operation
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TN-49-03
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05/2007
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305.07 KB
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Technical Note
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Calculating Memory System Power for RLDRAM 2:
Details how RLDRAM 2 devices consume power and provides tools to estimate power consumption
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TN-49-04
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11/2007
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1.64 MB
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Technical Note
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PCN/EOL Systems:
Explains Micron's product change notification and end-of-life systems.
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CSN-12
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04/2012
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79.21 KB
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Customer Service Note
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Wafer Packaging and Packaging Materials:
Provides complete shipping and recycling information about each of the materials used for shipping Micron's products.
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CSN-20
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09/2011
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776.24 KB
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Customer Service Note
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Bare Die SiPs and MCMs:
Describes design considerations for bare die SiPs and MCMs.
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CSN-18
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04/2009
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151.06 KB
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Customer Service Note
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Shipping Quantities:
Provides tables of part quantity.
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CSN-04
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04/2012
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472.27 KB
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Customer Service Note
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Micron KGD Definitions:
Describes the testing specifications and parameters for Micron's KGD-C1 and KGD-C2 DRAM die.
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CSN-22
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07/2009
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65.52 KB
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Customer Service Note
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Micron Component and Module Packaging:
Explanation of Micron packaging labels and procedures.
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CSN-16
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02/2012
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887.13 KB
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Customer Service Note
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ESD Precautions for Die/Wafer Handling and Assembly:
Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.
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CSN-24
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08/2010
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119.08 KB
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Customer Service Note
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Electronic Data Interchange:
Describes EDI transmission sets, protocol, and contacts.
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CSN-06
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09/2005
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53.5 KB
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Customer Service Note
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RMA Procedures for Packaged Product and Bare Die Devices:
Outlines standard returned material authorization (RMA) procedures, as well as the differences associated with bare die RMAs.
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CSN-07
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10/2010
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82.64 KB
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Customer Service Note
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ISO System Management Standards:
Describes ISO system management standards.
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CSN-08
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04/2004
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39.18 KB
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Customer Service Note
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The Future of Memory and Storage:
Overview of trends for main memory and Flash memory
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12/2009
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1.54 MB
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Presentation
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RLDRAM II Power Calculator:
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08/2011
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281 KB
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Power Calculator
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DRAM Component Part Numbering System:
Part numbering guide for DDR3/DDR2/DDR/SDR SDRAM, Mobile LPDRAM, and RLDRAM components
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04/2012
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36.89 KB
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Part Numbering Guide
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FBGA Date Codes:
Date codes for FBGA-packaged components
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08/2005
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22.36 KB
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Part Numbering Guide
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Moisture Absorption in Plastic Packages:
Describes shipping procedures for preventing memory devices from absorbing moisture and recommendations for baking devices exposed to excessive moisture
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TN-00-01
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02/2010
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87.26 KB
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Technical Note
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Accelerate Design Cycles with Simulation Models:
Micron supplies the tools and guidelines necessary to verify new designs prior to layout. This technical note discusses software model support, signal integrity optimization, and logic circuit design.
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TN-00-09
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02/2010
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206.91 KB
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Technical Note
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Micron Wire-Bonding Techniques:
This technical note provides guidance on wire bonding techniques for both nickel-palladium (NiPd) and aluminum (Al) bond pads on Micron products.
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TN-00-22
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11/2010
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66.13 KB
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Technical Note
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Leverage Existing RLDRAM® 2 and DDR3 PHY to Design in New RLDRAM:
RLDRAM 3 and DDR3 PHY features comparison, highlighting how both RLDRAM 2 and DDR3 PHY can be easily leveraged to design in RLDRAM 3.
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Presentation
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05/2011
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75.75 KB
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Presentation
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Micron BGA Manufacturer's User Guide:
Provides information to enable customers to easily integrate both leading-edge and legacy Micron's ball grid array (BGA) packages into their manufacturing processes. It is intended as a set of high-level guidelines and a reference manual describing typical package-related and manufacturing process-flow practices.
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CSN-33
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07/2011
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353.32 KB
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Customer Service Note
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RLDRAM 3 Design Guide:
Contains practical recommendations for developing high-performance memory subsystems while ensuring stability for long-term reliable operation of the devices.
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TN-44-01
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08/2011
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723.41 KB
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Technical Note
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RLDRAM 3 Power Calculator:
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08/2011
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290 KB
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Power Calculator
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Product Marks/Product and Packaging Labels:
Explains product part marking, and product and packaging labels.
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CSN-11
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04/2012
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724.89 KB
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Customer Service Note
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RLDRAM Memory Flyer :
Describes the high-bandwidth, low-latency, high-density features of RLDRAM 3 and RLDRAM 2 memory
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Product Flyer
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02/2012
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738.96 KB
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Product Flyer
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Bypass Capacitor Selection for High-Speed Designs:
Describes bypass capacitor selection for high-speed designs.
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TN-00-06
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03/2011
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481.9 KB
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Technical Note
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