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Technical Notes

TN-12-30: NOR Flash Cycling Endurance and Data Retention (pdf)

  • File Type:
  • PDF
  • Updated:
  • 09/18/2015

Description

(TN-12-30)

This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

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