N25Q064A13E12D1F

Orderable parts

Specs

Data Sheets

64Mb, 3V, Multiple I/O Serial Flash Memory with Improved Erase Time – Secure Version

N25Q064A13ExxD1x
  • File Type: PDF
  • Updated: 2015-04-10

Simulation Models

IBIS_N25Q064A13EPPD v1.6

PP= 12, 14, 53, F6, F8, SE, SF, V1, V7, W7, W9.
  • File Type: ZIP
  • Updated: 2014-10-24

Verilog model, N25Q, 64Mb, 3V, v1.2

Micron XIP, Hold pin
  • File Type: GZ
  • Updated: 2014-01-08

Technical Notes

TN-00-08: Thermal Applications

Describes some considerations in thermal applications for Micron memory devices
  • File Type: PDF
  • Updated: 2019-04-17

TN-12-30: NOR Flash Cycling Endurance and Data Retention

This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.
  • File Type: PDF
  • Updated: 2017-11-15
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Customer Service Notes

CSN-16: Micron Component and Module Packaging

Explanation of Micron packaging labels and procedures.
  • File Type: PDF
  • Updated: 2019-04-29

CSN-18: Bare Die SiPs and MCMs

Describes design considerations for bare die SiPs and MCMs.
  • File Type: PDF
  • Updated: 2009-04-06
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