M45PE80-VMW6TG

Orderable parts

M45PE80-VMW6TG

Specs

  • Chipset Validation
    N/A
  • Density
    8Mb
  • FBGA Code
    N/A
  • Media
    Tape & Reel
  • Op. Temp.
    -40C to +85C
  • Part Family
    M45PE
  • Part Status
    End of Life
  • PLP
    No
  • PLP Start Date
    N/A
  • Type
    Page Erase
  • Width
    x1

Data Sheets

8Mb Low-Voltage Serial NOR Flash: M45PE80

8Mb, Low-Voltage, Page-Erasable, Serial NOR Flash Memory with Byte Alterability, 75 MHz Serial Peripheral Interface
  • File Type: PDF
  • Updated: 3/18/2014

RoHS

China RoHS Certificate

Part-specific certification as required by China's Management Methods for Controlling Pollution by Electronic Information Products.
  • File Type: (PDF)
  • Updated: 12/2018

RoHS Certificate of Compliance

Part-specific certification of how this product meets the requirements of the current DIRECTIVE 2011/65/EU and 2015/863/EU, a.k.a. Restriction of Hazardous Substances (RoHS) Directive (Recast) without exemptions.
  • File Type: (PDF)
  • Updated: 12/2018

SIM Models

M45PE80 VHDL 1.1 25MHZ

  • File Type: ZIP
  • Updated: 5/7/2010

M45PE80 VLOG V14

  • File Type: ZIP
  • Updated: 5/7/2010

Technical Notes

TN-00-08: Thermal Applications

Describes some considerations in thermal applications for Micron memory devices
  • File Type: PDF
  • Updated: 2/15/2018

TN-12-30: NOR Flash Cycling Endurance and Data Retention

This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.
  • File Type: PDF
  • Updated: 11/15/2017

Customer Service Notes

Micron Component and Module Packaging

Explanation of Micron packaging labels and procedures.
  • File Type: PDF
  • Updated: 10/12/2018

ESD Precautions for Die/Wafer Handling and Assembly

Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.
  • File Type: PDF
  • Updated: 8/5/2010
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