M25PE40S-VMW6G

Orderable parts

M25PE40S-VMW6G

Specs

  • Chipset Validation
    N/A
  • Density
    4Mb
  • FBGA Code
    N/A
  • Media
    Tube
  • Op. Temp.
    -40C to +85C
  • Part Status
    Obsolete
  • PLP
    No
  • PLP Start Date
    N/A
  • Type
    Page Erase
  • Width
    x1

RoHS

China RoHS Certificate

Part-specific certification as required by China's Management Methods for Controlling Pollution by Electronic Information Products.
  • File Type: (PDF)
  • Updated: 01/2019

RoHS Certificate of Compliance

Part-specific certification of how this product meets the requirements of the current DIRECTIVE 2011/65/EU and 2015/863/EU, a.k.a. Restriction of Hazardous Substances (RoHS) Directive (Recast) without exemptions.
  • File Type: (PDF)
  • Updated: 01/2019

Simulation Models

M25PE40_2.7-3.6V_75MHz_110nm VRG

  • File Type: GZ
  • Updated: 6/7/2011

M25PE40 VG 1.0 Verilog

  • File Type: ZIP
  • Updated: 5/7/2010

M25PE40 VHDL 1.0

  • File Type: ZIP
  • Updated: 5/7/2010

M25PE_IBIS, 40-VMW6, 110nm, SOP2-8/208mils (SO8W), 2.7-3.6V, v1.0

  • File Type: IBS
  • Updated: 5/7/2010

Technical Notes

TN-00-08: Thermal Applications

Describes some considerations in thermal applications for Micron memory devices
  • File Type: PDF
  • Updated: 2/15/2018

TN-12-30: NOR Flash Cycling Endurance and Data Retention

This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.
  • File Type: PDF
  • Updated: 11/15/2017

Customer Service Notes

Micron Component and Module Packaging

Explanation of Micron packaging labels and procedures.
  • File Type: PDF
  • Updated: 10/12/2018

ESD Precautions for Die/Wafer Handling and Assembly

Describes the benefits of controlling ESD in the workplace, including higher yields and improved quality and reliability, resulting in reduced manufacturing costs.
  • File Type: PDF
  • Updated: 8/5/2010
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