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X28F160C3TD70C

Specs

Orderable Parts for: X28F160C3TD70C
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
X28F160C3TD70C Obsolete N/A N/A N/A N/A N/A N/A N/A
Detailed Specifications
Density 16Mb Part Status Obsolete Width x16 Voltage 2.7V-3.6V
Package Die Pin Count n/a Speed 70ns RoHS Yes
Op Temp -40C to +85C Applications Embedded Part Family B3 Configuration Top Boot
Media Product Grouping

Sim Models & Software

Software
Software Driver

General low-level driver for C3 parallel NOR.

  • File Type: ZIP
  • Updated: 04/05/2005

RoHS Certificates

RoHS Certificates
RoHS Certificate of Compliance (PDF)

Part-specific certification of how this product meets the requirements of the current DIRECTIVE 2002/95/EC, a.k.a. Restriction of Hazardous Substances (RoHS) Directive.

  • File Type: (PDF)
  • Updated: 12/2016
RoHS Certificates
China RoHS Certificate (PDF)

Part-specific certification as required by China's Management Methods for Controlling Pollution by Electronic Information Products.

  • File Type: (PDF)
  • Updated: 12/2016

Documentation & Support

See All Parallel NOR Flash Documentation
Technical Notes
Search (37) Parallel NOR Flash Technical Notes
Technical Notes


(TN-13-43) Password access is a security enhancement in 65nm M29EW, P30, P33, and J3 devices. This technical note explains how this feature protects main-array memory block information by preventing READ, WRITE, or PROGRAM operations until a valid 64-bit password is entered.

  • File Type: PDF
  • Updated: 07/22/2016
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Technical Notes


(TN-1322) Explains how to convert a system design.

  • File Type: PDF
  • Updated: 08/06/2015
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Search (37) Parallel NOR Flash Technical Notes

Where to Buy

Orderable Parts
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
X28F160C3TD70C Obsolete N/A N/A N/A N/A N/A N/A N/A
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