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TE28F256J3F105A

Data Sheets (1)

Data Sheet
256Mb, 65nm Embedded Parallel NOR Flash
  • File Type: PDF
  • Updated: 02/2011

Specs

Orderable Parts for: TE28F256J3F105A
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
TE28F256J3F105A Obsolete N/A N/A N/A N/A N/A N/A N/A
Detailed Specifications
Density 256Mb Part Status Obsolete Width x8/x16 Voltage 2.7V-3.6V
Package TSOP Pin Count 56-pin Speed 105ns RoHS No
Op Temp -40C to +85C Applications Embedded Part Family J3 Configuration Uniform
Media Tray Product Grouping

Sim Models & Software

Sim Models
Software
Software Driver

Enhanced driver for J3, J3vD, P30 and P33 parallel NOR. Download the user guide for the EFD here.

  • File Type: ZIP
  • Updated: 11/30/2009

Documentation & Support

See All Parallel NOR Flash Documentation
Technical Notes
Search (38) Parallel NOR Flash Technical Notes
Technical Notes


(TN-12-50) Software driver for J3F parallel NOR Flash memory. Download the low-level driver described in this document here.

  • File Type: PDF
  • Updated: 01/28/2013
Technical Notes


(TN-12-06) This technical note provides a guide for modifying the MTD device-layer software for correct use with Micron P30, P33, and J3 devices. It also describes the modifications required in the Linux environment.

  • File Type: PDF
  • Updated: 10/17/2011
Technical Notes


(TN-12-05) This document describes a method of password protecting blocks using Micron's M29EW device, as an example.

  • File Type: PDF
  • Updated: 03/11/2011
Technical Notes


(TN-13-50) This technical note describes the process for converting a system design from the Micron M29W devices to MT28EW single-level cell NOR Flash devices, including 128Mb and 256Mb densities.

  • File Type: PDF
  • Updated: 02/10/2017
Technical Notes


(TN-13-43) Password access is a security enhancement in 65nm M29EW, P30, P33, and J3 devices. This technical note explains how this feature protects main-array memory block information by preventing READ, WRITE, or PROGRAM operations until a valid 64-bit password is entered.

  • File Type: PDF
  • Updated: 07/22/2016
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Technical Notes


(TN-1322) Explains how to convert a system design.

  • File Type: PDF
  • Updated: 08/06/2015
Search (38) Parallel NOR Flash Technical Notes

Parts with the same Data Sheet (2)

TE28F256J3F105A ( Current ) PC28F256J3F95A RC28F256J3F95A
Part Status Obsolete Contact Factory Contact Factory
Density 256Mb 256Mb 256Mb
Width x8/x16 x8/x16 x8/x16
Voltage 2.7V-3.6V 2.7V-3.6V 2.7V-3.6V
Package TSOP Easy BGA Easy BGA
Pin Count 56-pin 64-ball 64-ball
Speed 105ns 95ns 95ns
RoHS No Yes No
Op Temp -40C to +85C -40C to +85C -40C to +85C
Applications Embedded Embedded Embedded
Part Family J3 J3 J3
Configuration Uniform Uniform Uniform
Media Tray Tray Tray
Product Grouping

Where to Buy

Orderable Parts
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
TE28F256J3F105A Obsolete N/A N/A N/A N/A N/A N/A N/A
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