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TE28F160B3TD70A

Specs

Orderable Parts for: TE28F160B3TD70A
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
TE28F160B3TD70A Obsolete N/A N/A N/A N/A N/A N/A N/A
Detailed Specifications
Density 16Mb Part Status Obsolete Width x16 Voltage 2.7V-3.6V
Package TSOP Pin Count 48-pin Speed 70ns RoHS No
Op Temp -40C to +85C Applications Embedded Part Family B3 Configuration Top Boot
Media Tray Product Grouping

Sim Models & Software

Software
Software Support Pack

This patch try to put read operation at head of write operation in nor_erase_prepare(), read out the data.

  • File Type: ZIP
  • Updated: 03/31/2016
Software Support Pack

Micron Nor flash don't support read operation after send write command.

  • File Type: ZIP
  • Updated: 03/31/2016
Software Support Pack

For some Norflashes,the size of the buffer program has been increased from 256 bytes to 512 bytes,2ms maximum timeout can not adapt to all the different vendor's norflash.

  • File Type: ZIP
  • Updated: 03/31/2016
Software Driver

General low-level driver for 128Mb, 256Mb, and 512Mb M29W parallel NOR.

  • File Type: ZIP
  • Updated: 02/24/2014
Software Driver

Software Driver file for M29W640F/M29W064F (64Mb)

  • File Type: ZIP
  • Updated: 04/04/2013

Documentation & Support

See All Parallel NOR Flash Documentation
Technical Notes
Search (37) Parallel NOR Flash Technical Notes
Technical Notes


(TN-13-43) Password access is a security enhancement in 65nm M29EW, P30, P33, and J3 devices. This technical note explains how this feature protects main-array memory block information by preventing READ, WRITE, or PROGRAM operations until a valid 64-bit password is entered.

  • File Type: PDF
  • Updated: 07/22/2016
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Technical Notes


(TN-1322) Explains how to convert a system design.

  • File Type: PDF
  • Updated: 08/06/2015
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Search (37) Parallel NOR Flash Technical Notes

Where to Buy

Orderable Parts
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
TE28F160B3TD70A Obsolete N/A N/A N/A N/A N/A N/A N/A
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