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RC28F256J3F95A

Data Sheets (1)

Data Sheet
256Mb, 65nm Embedded Parallel NOR Flash
  • File Type: PDF
  • Updated: 02/2011

Specs

Orderable Parts for: RC28F256J3F95A
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
RC28F256J3F95A Production Dry Pack N/A N/A N/A No N/A
Detailed Specifications
Density 256Mb Part Status Production Width x8/x16 Voltage 2.7V-3.6V
Package Easy BGA Pin Count 64-ball Speed 95ns RoHS No
Op Temp -40C to +85C Applications Embedded Part Family J3 Configuration Uniform
Media Tray Product Grouping

Sim Models & Software

Sim Models
Software
Software Driver

Enhanced driver for J3, J3vD, P30 and P33 parallel NOR. Download the user guide for the EFD here.

  • File Type: ZIP
  • Updated: 11/30/2009

Documentation & Support

See All Parallel NOR Flash Documentation
Technical Notes
Search (37) Parallel NOR Flash Technical Notes
Technical Notes


(TN-12-50) Software driver for J3F parallel NOR Flash memory. Download the low-level driver described in this document here.

Technical Notes


(TN-12-06) This technical note provides a guide for modifying the MTD device-layer software for correct use with Micron P30, P33, and J3 devices. It also describes the modifications required in the Linux environment.

  • File Type: PDF
  • Updated: 10/17/2011
Technical Notes


(TN-12-05) This document describes a method of password protecting blocks using Micron's M29EW device, as an example.

Technical Notes


(TN-13-43) Password access is a security enhancement in 65nm M29EW, P30, P33, and J3 devices. This technical note explains how this feature protects main-array memory block information by preventing READ, WRITE, or PROGRAM operations until a valid 64-bit password is entered.

  • File Type: PDF
  • Updated: 07/22/2016
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Technical Notes


(TN-1322) Explains how to convert a system design.

  • File Type: PDF
  • Updated: 08/06/2015
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Search (37) Parallel NOR Flash Technical Notes

Parts with the same Data Sheet (4)

RC28F256J3F95A ( Current ) JS28F256J3F105A JS28F256J3F105B PC28F256J3F95A TE28F256J3F105A
Part Status Production Production Contact Factory Production Obsolete
Density 256Mb 256Mb 256Mb 256Mb 256Mb
Width x8/x16 x8/x16 x8/x16 x8/x16 x8/x16
Voltage 2.7V-3.6V 2.7V-3.6V 2.7V-3.6V 2.7V-3.6V 2.7V-3.6V
Package Easy BGA TSOP TSOP Easy BGA TSOP
Pin Count 64-ball 56-pin 56-pin 64-ball 56-pin
Speed 95ns 105ns 105ns 95ns 105ns
RoHS No Yes Yes Yes No
Op Temp -40C to +85C -40C to +85C -40C to +85C -40C to +85C -40C to +85C
Applications Embedded Embedded Embedded Embedded Embedded
Part Family J3 J3 J3 J3 J3
Configuration Uniform Uniform Uniform Uniform Uniform
Media Tray Tray Tape & Reel Tray Tray
Product Grouping

Where to Buy

Orderable Parts
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
RC28F256J3F95A Production Dry Pack N/A N/A N/A No N/A
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