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M29W512GH7AN6E

Data Sheets (1)

Data Sheet
Parallel NOR Flash Embedded Memory – Automotive Qualified
  • File Type: PDF
  • Updated: 09/2015

Specs

Orderable Parts for: M29W512GH7AN6E
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
M29W512GH7AN6E Production Dry Pack N/A N/A N/A No N/A
Detailed Specifications
Density 512Mb Part Status Production Width x8/x16 Voltage 2.7V-3.6V
Package TSOP Pin Count 56-pin Speed 70ns RoHS Yes
Op Temp -40C to +85C Applications Automotive Part Family M29W Configuration Low Lock
Media Tray Product Grouping

Sim Models & Software

Sim Models
IBIS

65nm M29W256G silicon model + m29w512g_tsop56.ebd file. Voltage corners: 1.65-1.95V, 2.7-3.6V. N= TSOP56. 6= -40C to +85C.

  • File Type: ZIP
  • Updated: 02/20/2014
Software
Software Driver

General low-level driver for 128Mb, 256Mb, and 512Mb M29W parallel NOR.

  • File Type: ZIP
  • Updated: 02/24/2014

RoHS Certificates

RoHS Certificates
RoHS Certificate of Compliance (PDF)

Part-specific certification of how this product meets the requirements of the current DIRECTIVE 2002/95/EC, a.k.a. Restriction of Hazardous Substances (RoHS) Directive.

  • File Type: (PDF)
  • Updated: 12/2016
RoHS Certificates
China RoHS Certificate (PDF)

Part-specific certification as required by China's Management Methods for Controlling Pollution by Electronic Information Products.

  • File Type: (PDF)
  • Updated: 12/2016

Documentation & Support

See All Parallel NOR Flash Documentation
Technical Notes
Search (37) Parallel NOR Flash Technical Notes
Technical Notes


(TN-13-43) Password access is a security enhancement in 65nm M29EW, P30, P33, and J3 devices. This technical note explains how this feature protects main-array memory block information by preventing READ, WRITE, or PROGRAM operations until a valid 64-bit password is entered.

  • File Type: PDF
  • Updated: 07/22/2016
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Technical Notes


(TN-1322) Explains how to convert a system design.

  • File Type: PDF
  • Updated: 08/06/2015
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Search (37) Parallel NOR Flash Technical Notes

Parts with the same Data Sheet (2)

M29W512GH7AN6E ( Current ) M29W512GH70N3E M29W512GH70N3E
Part Status Production Production Production
Density 512Mb 512Mb 512Mb
Width x8/x16 x8/x16 x8/x16
Voltage 2.7V-3.6V 2.7V-3.6V 2.7V-3.6V
Package TSOP TSOP TSOP
Pin Count 56-pin 56-pin 56-pin
Speed 70ns 80ns 80ns
RoHS Yes Yes Yes
Op Temp -40C to +85C -40C to +125C -40C to +125C
Applications Automotive Automotive Automotive
Part Family M29W M29W M29W
Configuration Low Lock
Media Tray Tray Tray
Product Grouping

Where to Buy

Orderable Parts
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
M29W512GH7AN6E Production Dry Pack N/A N/A N/A No N/A
Contact Your Sales Rep
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Check with Distributors
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