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General low-level driver for M29F parallel NOR. Download the technical note for this driver here.
Part-specific certification of how this product meets the requirements of the current DIRECTIVE 2011/65/EU and 2015/863/EU, a.k.a. Restriction of Hazardous Substances (RoHS) Directive (Recast) without exemptions.
Part-specific certification as required by China's Management Methods for Controlling Pollution by Electronic Information Products.
Explains how to convert a system design.
This technical note provides a guide for modifying the memory technology device (MTD) layer software for the purpose of correctly using Micron M29 family Flash memory devices in a Linux environment. This document also describes the modifications required to make a Linux...
This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.
This technical note describes the process for converting a system design from the Micron M29W devices to MT28EW single-level cell NOR Flash devices, including 128Mb and 256Mb densities.
The first section of this customer service note describes the product marks and labels we place on our devices. The second section describes the labels used on and in our packaging.
Provides information to enable customers to easily integrate both leading-edge and legacy Micron's ball grid array (BGA) packages into their manufacturing processes. It is intended as a set of high-level guidelines and a reference manual describing typical package-related and...