logo-micron

Add Bookmark(s)


To:

Email


Bookmark(s) shared successfully!

Please provide at least one email address.

M28W160ECB70ZB6E

Data Sheets (1)

Data Sheet
16Mb (1Mb x16), 3V, Boot Block, Parallel NOR Flash Memory
  • File Type: PDF
  • Updated: 02/2011

Specs

Orderable Parts for: M28W160ECB70ZB6E
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
M28W160ECB70ZB6E Production Dry Pack N/A N/A N/A No N/A
Detailed Specifications
Density 16Mb Part Status Production Width x16 Voltage 2.7V-3.6V
Package TFBGA Pin Count 46-ball Speed 70ns RoHS Yes
Op Temp -40C to +85C Applications Embedded Part Family M28W Configuration Bottom Boot
Media Tray Product Grouping

Sim Models & Software

Sim Models
Verilog

M28W160EC_VG10.tar

  • File Type: ZIP
  • Updated: 05/07/2010
Software
Software Driver

General low-level driver for M28W E/EC parallel NOR.

  • File Type: ZIP
  • Updated: 01/09/2006

RoHS Certificates

RoHS Certificates
RoHS Certificate of Compliance (PDF)

Part-specific certification of how this product meets the requirements of the current DIRECTIVE 2002/95/EC, a.k.a. Restriction of Hazardous Substances (RoHS) Directive.

  • File Type: (PDF)
  • Updated: 12/2016
RoHS Certificates
China RoHS Certificate (PDF)

Part-specific certification as required by China's Management Methods for Controlling Pollution by Electronic Information Products.

  • File Type: (PDF)
  • Updated: 12/2016

Documentation & Support

See All Parallel NOR Flash Documentation
Technical Notes
Search (37) Parallel NOR Flash Technical Notes
Technical Notes


(TN-13-43) Password access is a security enhancement in 65nm M29EW, P30, P33, and J3 devices. This technical note explains how this feature protects main-array memory block information by preventing READ, WRITE, or PROGRAM operations until a valid 64-bit password is entered.

  • File Type: PDF
  • Updated: 07/22/2016
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Technical Notes


(TN-1322) Explains how to convert a system design.

  • File Type: PDF
  • Updated: 08/06/2015
Technical Notes


(TN-12-30) This technical note defines the industry standards for this testing, Micron's NOR Flash testing methodology, and the two key metrics used to measure NOR device failure: cycling endurance and data retention.

Search (37) Parallel NOR Flash Technical Notes

Parts with the same Data Sheet (3)

M28W160ECB70ZB6E ( Current ) M28W160ECB70ZB6U M28W160ECT70ZB6E M28W160ECT70ZB6U
Part Status Production Contact Factory Production Contact Factory
Density 16Mb 16Mb 16Mb 16Mb
Width x16 x16 x16 x16
Voltage 2.7V-3.6V 2.7V-3.6V 2.7V-3.6V 2.7V-3.6V
Package TFBGA TFBGA TFBGA TFBGA
Pin Count 46-ball 46-ball 46-ball 46-ball
Speed 70ns 70ns 70ns 70ns
RoHS Yes Yes Yes Yes
Op Temp -40C to +85C -40C to +85C -40C to +85C -40C to +85C
Applications Embedded Embedded Embedded Embedded
Part Family M28W M28W M28W M28W
Configuration Bottom Boot Bottom Boot Top Boot Top Boot
Media Tray Tray Tray Tray
Product Grouping

Where to Buy

Orderable Parts
Status Media FBGA Code SPD Data Chipset
Validation
PLP Start Date Alternative Part
M28W160ECB70ZB6E Production Dry Pack N/A N/A N/A No N/A
Contact Your Sales Rep
Contact A Rep
- OR -
Check with Distributors
See All Distributors