Module / Motherboard Testing
Micron Server Test
View recorded test results
Two motherboards are used to perform the qualification tests; the minimum
load is run in a system equipped with a single CPU while the maximum load is run
in a system equipped with dual processors. Both systems use the latest BIOS revision.
- Tests performed use both the minimum and maximum memory configurations supported
by the motherboard.
- The testing of each motherboard uses 8 hours of power cycling in both a Windows and
DOS operating system.
- Verification of memory configuration, size, and type ensures that the system has detected
the memory properly.
- The testing of each motherboard uses one complete loop using comprehensive
memory diagnostics at ambient temperature and nominal voltage.
The testing of each motherboard uses comprehensive memory diagnostics at the
following temperature and voltage conditions:
1.
High Temperature
Low Voltage
|
2.
High Temperature
High Voltage
|
3.
Low Temperature
Low Voltage
|
4.
Low Temperature
High Voltage |
View recorded test results
Full qualification testing uses the fastest CPU supported by the motherboard as well
as the latest BIOS revision.
- Tests performed use both the minimum and maximum memory configurations supported
by the motherboard.
- The measurement of signal quality may occur on critical signals to ensure the
memory module meets data sheet specifications.
- The duration of the memory diagnostic testing is 12 hours for each corner. Total
test time per board is 48 hours.
- Verification of memory configuration, size, and type ensures the system has detected
the memory properly.
The testing of each motherboard uses comprehensive memory diagnostics at the following
temperature and voltage conditions:
1.
High Temperature
Low Voltage
|
2.
High Temperature
High Voltage
|
3.
Low Temperature
Low Voltage
|
4.
Low Temperature
High Voltage |
View recorded test results
Initial evaluation consists of multiple boot-up testing into two different operating
systems, as well as a minimum of 4 hours of comprehensive memory diagnostic testing. The qualification test uses the fastest CPU supported by the motherboard as well as the latest BIOS revision.
- Tests performed use both the minimum and maximum memory configurations supported
by the motherboard.
- The testing of each motherboard for one complete loop uses comprehensive memory
diagnostics at ambient temperature and nominal voltage conditions.
- The testing of each motherboard uses typical and graphics-intensive applications
in at least one O/S environment for a minimum of 24 hours to ensure system compatibility
with memory.
- Verification of memory configuration, size, and type ensures the system has detected
the memory properly.
Micron's test conditions, used to qualify Micron memory products, meet or exceed
Intel's Full and Basic Functional Test Procedures as defined at Intel's "Desktop
Board Component Functional Testing Levels" Web page,
http://developer.intel.com/design/motherbd/genqual.htm.
Contact your Micron Sales Representative for additional details.