Micron NAND Flash Memory-Technotes

Title and Description	ID Number	Last Update	Software Downloads
TN-00-01: Moisture Absorption in Plastic Packages - Describes the shipping procedures that ensure Micron’s customers receive memory devices that do not exhibit the popcorn effect	TN-00-01	Mar 2007
TN-00-06: Bypass Capacitor Selection for High-Speed Designs	TN-00-06	Sep 1999
TN-00-07: IBIS Behavioral Models	TN-00-07	Sep 1999
TN-00-08: Thermal Applications - Defines a general method and criteria for measuring and ensuring that Micron components and modules do not exceed the maximum allowable temperature.	TN-00-08	Feb 2007
TN-00-09: Accelerate Design Cycles With Micron Simulation Models	TN-00-09	Oct 2006
TN-00-14: Understanding the Quality and Reliability Requirements for Bare Die Applications	TN-00-14	Sep 2001
TN-00-15: Recommended Soldering Parameters	TN-00-15	Mar 2007
TN-00-17: Timing Specification Derating for High Capacitance Output Loading - Describes how to create capacitance derating data for Micron products that can then be used in preliminary evaluations of system timing	TN-00-17	May 2004
TN-00-18: Uprating of Semiconductors for High-Temperature Applications - Describes the issues associated with temperature uprating and the risks involved in using components and/or systems outside the manufacturer’s environmental specifications	TN-00-18	Feb 2007
TN-00-19: Thinning Considerations for Wafer Products - Information on optimal wafer-thinning processes to meet specific customer requirements	TN-00-19	Nov 2004
TN-29-01: NAND Flash Performance Increase - Using the Micron® PAGE READ CACHE MODE Command	TN-29-01	Jun 2007
TN-29-03: Using Micron MT29F2G08AACWP NAND Flash Memory in Toshiba TC58NVG1S3BTG00 Applications	TN-29-03	Jun 2007
TN-29-04: Using Micron MT29F2G08AACWP NAND Flash Memory in 2Gb Samsung K9F2G08U0A Applications	TN-29-04	Jun 2007
TN-29-05: Micron ECC Module for NAND Flash via Xilinx™ Spartan™-3 FPGA	TN-29-05	Jun 2007	Download VHDL Code
TN-29-06: Micron NAND Flash Controller via Xilinx Spartan-3 FPGA	TN-29-06	Apr 2005	Download VHDL Code
TN-29-07: Small Block vs. Large Block NAND Devices	TN-29-07	Jun 2007
TN-29-08: Hamming Codes for NAND Flash Memories	TN-29-08	Jun 2007
TN-29-10: Freescale™ DragonBall™ MX1 Adaptation for NAND Flash Memory	TN-29-10	Jun 2007	Download NAND Low Level Flash Drivers
TN-29-11: NAND Flash Security	TN-29-11	Jun 2007
TN-29-13: Monitoring Ready/Busy Status in 2, 4, and 8Gb Micron NAND Flash Devices	TN-29-13	Jun 2007
TN-29-14: NAND Flash Performance Increase with PROGRAM PAGE CACHE MODE Command	TN-29-14	Jun 2007
TN-29-15: NAND Flash Performance Improvement Using Internal Data Move - NAND data management capabilities and higher system performance through NAND Flash internal data moves	TN-29-15	Jun 2007
TN-29-16: Boot-from-NAND Using Micron MT28F1G08ABA NAND Flash with the Texas Instruments™ OMAP™ 2420 Processor	TN-29-16	Jun 2007
TN-29-17: NAND Flash Design and Use Considerations - Describes design and use considerations for NAND Flash memory, focusing on bad-block identification and error correction.	TN-29-17	Aug 2006
TN-29-18: Booting from Embedded MMC - Describes booting from an embedded ARM processor in the MMC environment.	TN-29-18	Oct 2007
TN-29-19: NAND Flash 101 - An Introduction to NAND Flash and How to Design It In to Your Next Product	TN-29-19	Nov 2006
TN-29-24: Micron Wire-Bonding Techniques	TN-29-24	Jun 2007
TN-29-25: Improving NAND Flash Performance Using Two-Plane Command Enabled Micron Devices - Describes the performance benefits of Micron two-plane commands, and provides implementation guidelines for making the best use of two-plane capabilities.	TN-29-25	Jun 2007
TN-29-26: NAND Flash Status Register Response in Cache Programming Operations - Describes status register responses when operating in cache programming modes.	TN-29-26	Jun 2007
TN-29-28: Memory Management in NAND Flash Arrays - Describes common NAND Flash memory-management methods for effective use of the NAND Flash memory array.	TN-29-28	Jul 2007

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NAND Flash Technical Notes

NAND Flash